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Using checkpoint alteration to gauge fault sensitivity of HPC scientific applications

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dc.contributor.authorRojas, Elvis
dc.contributor.authorTodd, Luis Carlos N.
dc.contributor.authorMeneses, Esteban
dc.date.accessioned2026-05-29T21:14:09Z
dc.date.available2026-05-29T21:14:09Z
dc.date.issued2025
dc.identifier.doihttps://doi.org/10.1109/IPDPSW66978.2025.00071
dc.identifier.urihttps://hdl.handle.net/20.500.12337/11696
dc.language.isoen_US
dc.publisherIEEE Xplore
dc.relationhttps://doi.org/10.1109/IPDPSW66978.2025.00071
dc.rightsacceso abierto
dc.source2025 IEEE International Parallel and Distributed Processing Symposium Workshops (IPDPSW)
dc.subjectCOMPUTACIÓN DE ALTO RENDIMIENTO
dc.subjectCIENCIA Y TECNOLOGÍA
dc.titleUsing checkpoint alteration to gauge fault sensitivity of HPC scientific applications
dc.typeartículo de investigación

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